Multimode Scanning Probe Microscope (Bruker)has all standard operating modes like SPM, AFM, MFM, LFM, TM, TR Nano indentation, lithography and many unique capabilities to characterize everything from mechanical to electricalproperties at high resolution.

The Nova Touch LX2 gas sorption analyzer from Quantachrome Instruments provides increased throughput and surpassing performance for BET surface area and pore size analyses. It can be used to determine the surface area as well as pore size distribution and pore volume of materials. It is equipped with four degassing ports for vacuum degassing and two analysis stations. It produces the BET surface area and pore size results using the classical helium void volume method. The color touch screen enables the live graphical and tabular displays of analysis. This equipment is equipped with a dedicated Po cell, dedicated Po transducer, and dedicated backfill transducer. It has a wide application in the measurement of catalysts for the automotive, fertilizer, fuel cell, and petrochemical industries. It is also used in the analysis of biomaterials, ceramics, cement, paints, sintered products, and magnetic tapes, etc.

COMSOL:Multiphysics Software COMSOL Multiphysics is a finite element analysis, solver and Simulation software /FEA Software package for various physics and engineering applications, especially coupled phenomena, ormultiphysics.The following modules (31) are available in MRC AC/DC Module, Acoustics Module, Batteries & Fuel Cells Module, CAD Import Module, CFD Module, Chemical Reaction Engineering Module, Corrosion Module, ECAD Import Module, Electrochemistry Module, Electrodeposition Module, Fatigue Module, Geomechanics Module, Heat Transfer Module, Live Link Products for CAD, LiveLink for MATLAB, LiveLink for Excel,Material Library, MEMS Module, Microfluidics Module, Molecular Flow Module, Multibody Dynamics Module, Nonlinear Structural Materials Module, Optimization Module, Particle Tracing Module, Pipe Flow Module, Plasma Module, RF Module, Semiconductor Module, Structural Mechanics Module, Subsurface Flow Module, Wave Optics Module. IC Cap Device Software Integrated Circuit Characterization and Analysis Program (IC-CAP) is the industry standard for DC and RF semiconductor device modeling. IC-CAP extracts accurate compact models used in high speed/digital, analog and power RF applications. The most advanced semiconductor foundries and IDMs rely on IC-CAP for modeling silicon CMOS, Bipolar, compound gallium arsenide (GaAs), gallium nitride (GaN) and many other device technologies. IC-CAP is the most advanced, customizable modeling software and includes measurement, simulation, optimization and statistical analysis tools.

200 mesh copper grid for TEm sample preparation

De Ionized water and R O water facility for internal as well as external user.

DMA 8000 (Perkin Elmer) is a technique widely used to characterize a material’s properties as a function of temperature, time, frequency, stress, atmosphere or a combination of these parameters. Its innovative design, high functionality, and flexible operation make the DMA 8000 ideal for advanced research and routine quality testing in the polymers, composites, pharmaceutical, and food industries.

High Vacuum Thermal/ e-beam Coating Unit (Model BC-300 HHV) is a versatile coating unit for thin film applications with facilities for evaporation, glow discharge cleaning etc. The system offers a variable source to target distance of 30cm-80cm & uniform deposition over 3 cm diameter.The temperature of the substrate can be varied from 27 degree C to 550 degree C Possible deposition materials are all semiconductors / oxides & metals.

Electrochemical workstation is ideal for fundamental research in electrochemistry, development and quality assurance of new sensors, corrosion/coatings, electrode material, membrane, conducting polymer, evaluation power device research such as battery materials, fuel cells, super capacitors and solar cells. It will be used for electro synthesis of conducting polymers, corrosion inhibition studies, super capacitor etc. It is capable for study of voltammetric techniques, pulsed techniques, corrosion & impedance etc.

The LS 55 (Perkin Elmer) Fluorescence spectrometer provides all types of data applications that require fluorescence, phosphorescence, bioluminescence, chemiluminescence etc. with excitation range of 200-800nm.

FT-IR Spectrum 2 (Perkin Elmer) is a compact, easy to use, powerful instrument with fully integrated, universal sampling system for measurements in the range of 4100-400 cm-1 for liquid (in KBr cell) and solid (in KBr pellets) samples. It can be used by developers and manufacturers of pharmaceuticals, traditional and herbal medicines from rapid raw material identification to sensitive analysis of formulated products. It also finds applications in IR sampling, spectral and field based analysis.

LECO's CCD-based Glow Discharge Spectrometer (GDS) provides routine elemental determination in most ferrous and nonferrous materials. The GDS500A features improved performance, stability, accuracy, and precision in steel, iron (including as-cast), aluminum, copper, zinc, nickel, cobalt, tungsten, and titanium. Low melting alloys, resulfurized steel, powder metals, and other difficult materials can be run in a production environment. Sample types include bulk, sheet, and wire, pressed, and mounted samples.

The unit is used for making samples for scanning electron microscopy conductive by depositing a thin layer of conductive gold over the samples.

The HMS-5000 series / HMS-7000 series Hall Effect Measurement Systems have automated magnet movement, variable temperature capability, and powerful analysis software. The systems can be used to characterize various materials including all semiconductors including Si, SiGe, SiC, GaAs, InGaAs, InP, GaN (N Type & P Type can be measured), metal layers, oxides, etc. Sample testing can be performed to demonstrate the system’s capability

The 6500 series of Precision Impedance Analyzers provide precise and fast testing of components at frequencies up to 120MHz. Basic measurement accuracy is±0.05% making the instruments the best in the class. Measurement Parameters: Capacitance (C), Inductance (L), Resistance (R),Reactance (X), Conductance (G),Susceptance (B), Dissipation Factor (D), Quality Factor (Q), Impedance (Z), Admittance (Y), Phase Angle (ø).

Production of Liquid nitrogen takes place in two distinct steps. First, nitrogen gas is produced from air. Second, the gaseous nitrogen is passed through a cryorefrigerator to liquefy the gas to produce liquid nitrogen. Plant producing capability is 40 liters/day of liquid nitrogen.

Xevo G2-S Q Tof (Waters, USA) mass spectrometer (Direct Mass ESI-APCI , MS-MS , LCMS , Solid State Probe) provides a wide range of mass analysis of small organic/inorganic/ organometallic compounds to large polymeric & roteomics samples including proteins & peptides. The Q Tof technology in this instrument provides superior HRMS, MS/MS and compatible mass resolution, matrix-tolerant dynamic range, quantitative performance, simultaneous mass accuracy and speed of analysis. Fast data directed analysis allows full structural characterization of unknown compounds. The UPLC/MS data acquisition comprehensively catalogs complex samples in a single analysis. Universal Ion Source architecture enables the most extensive range of interface capabilities to service the broadest range of applications.

This system has Capabilities of • Automatic Micro- Vickers, Macro-Vickers, Knoophardness tester • Variable loads are possible for Vickers 20 gf-30 kgf, for Knoop 20 gf -2k gf • Variable loading speed • Display resolution: 0.1 HV and 0.1 HK.

Microwave reactors (CEM Discover) open avenues for a wide range of conditions and variables to be investigated. The reactions can be run up to 300°C and 300 psi in 10-mL to 80-mL sealed vessels. Additionally, open-vessel reactions can be run using conventional round bottom flasks (up to 125 mL) equipped with a reflux condenser.

ECS 400MHz (JEOL) NMR spectrometer is a 2-channel console with a flexible broad band RF performance. It is capable of providing spectra of a variety of NMR- active nuclei such as 1H, 13C, 19F and metals like 29Si, 31P, 119Sn, 51V, 77Se,113Cd, 195Pt, etc. In distinct chemical environments without any time delay. Its low temperature accessory permits variable temperature. Capable of recording 2D spectra (COSY, NOESY, HETCOR, etc.)

Inverted optical microscope • Large area scanning is also possible • Suitable for metallic, ceramic, polymer and biological samples • Bright field, dark field and polarized imaging • IVF contrast system • Resolution: 0.1 micro meter

Pulverisette 6 (Fritsch) Planetary Ball Mill is capable of mixing and perfect homogenising of emulsions or pastes. Maximum output sample quantity is40 ml. It has Tungsten carbide and tempered steel ball and bowl material with variable speed upto 650 rpm. It has GTM attachment for temperature monitoring.

This system has Compact & flexible configuration. • High resolution: <0.5 cm-1 and minimum measurement range is 100 cm-1. • Confocal optics and fully automated 2D, 3D & 4DRaman imaging. • Lasers available: Presently 532 nm Laser is working. 325 nm and 785nm Lasers are not working.

RF / DC Magnetron Sputtering (APT) can coat thin films of metals, semiconductors and oxides. It is also designed to coat thin film multi-layers. The vacuum production is based on turbo molecular pump capable of producing vacuum up to 1x10^6 Torr. The system is designed for sputter-up configuration. One can use two magnetron cathodes (size of each sputtering target is 2 inches) with possibility of both RF and DC operations. Rotatable substrate holder is capable of holding substrates of sizes from one cm to one inch diameter and substrate heating up to 800 C is also possible. The distance between the substrate holder and sputtering source is adjustable. The system has two mass flow controllers, one for argon and the other for nitrogen / oxygen. One can do reactive sputtering also.

The AbrasiMatic® 300 (Buehler) abrasive cutter is a bench-top cutter featuring manual cutting action in 3 directions & automated cutting in 1 direction. This gives the user the maximum versatility to section a wide variety of sample materials, sizes and geometries. It is engineered with innovative capabilities to be used in both production support and laboratory environments.

Simplimet 3000 (Buehler) Automatic Mounting Press is a durable press with basic features that provides effective mounting, increases productivity and specimen consistency verses manual mounting press. Electrohydraulic operation requires no air. Enhanced features include 25 user definable methods and thermoplastic parameters.

SEM X Sectional Sample preparation facility and EBSD sample preparation facility

The Precision Ion Polishing System II (PIPS II,GATAN) is a revolutionary enhancement of the PIPS I, which has defined the standard for TEM sample preparation for 20 years. The PIPS II incorporates the patented Whisperlok® with the positioning stage (X, Y) for precise centering of the milling target. The PIPS II in corporates a 10 inch touch screen for ease of use, increased control and reproducibility of the milling process. The Digital Zoom Microscope monitors the polishing process, The color images can be stored in Gatan’s Digital Micrograph® software for review and analysis while the sample is in the TEM.

TenuPol-5 (Struers) : A perforated specimen for transmission electron microscopy can be made from a sample of 3 mm diameter in just a few minutes. The specimen is polished from both sides simultaneously, thus providing a structure with minimum deformation. When the perforation appears, the polishing can automatically be stopped by the infrared detector system, and the specimen is ready for the TEM analysis. Electrolytic pre-thinning or blanking can also easily be carried out.

Ultramet 2005 (Buehler) sonic clear with a 9.5L capacity quickly cleans samples to prepare for the next preparation step. Faster and more consistent than other methods, samples are immersed in solution and saturated with ultra high frequency sound waves cleaning difficult to reach areas, cracks and irregular surfaces. Features a 60 minute timer and continuous clean mode. Ultra sonicator with Probe is also available for multi purpose.

Cast n Vac 1000 (Buehler) evacuates entrapped air from specimens. Without the presence of air, the mounting compound fills the specimen pores and eliminates gaps between the specimen and the compound. As a result, edge retention is enhanced and friable samples are supported during grinding and polishing.

Isomet 4000 (Buehler) is a versatile linear precision saw which enables to cut all kind of delicate specimen with minimal damage due to deformation.

The Metaserv 250 & EcoMet 250 Grinder-Polisher has been designed to meet the needs of the materials analyst requiring the versatility of manual or automated sample preparation. The EcoMet provides controls upgrade to a color touch-screen control panel for Z-axis material removal by depth, method creation/storage and automated dispenser programmability.

Nova Nano FE-SEM 450 (FEI) provides ultra high resolution characterization & analysis giving precise, true nanometer scale information. Advanced optics & detection, including beam deceleration, in lens ETD (SE), TLD (custom), lens mounted DBS & LVD offer best selection of information & image optimization. It gives a resolution of 1.6 nm at 1 kv (TLD-SE) & <1 nm at 15 kv (TLD-SE). In this system EDS and EBSD attachment facility is also available

The MicroXact's SPS-2200 system IS premier manual probe station designed to be flexible and easy to use with up to 200 mm wafer capabilities, DC or RF probes, optional thermal chuck, and a variety of shielding options. The probe station can be used for the wide range of applications, such as failure analysis, reliability tes t ing, IV/CV tes t ing and gener a l characterization. Thermal chuck with temperature range of -20 °C to +200 °C is there. Applications: • CMOS Transistor: Id-Vg, Id-Vd, Vth, breakdown, capacitance, QSCV, etc. • Bipolar Junction Transistor (BJT): lc-Vc, diode, Gummel plot, breakdown, hfe, capacitance, etc. • Discrete device: Id-Vg, Id-Vd, lc-Vc, diode, etc. • Memory: Vth, capacitance, endurance test, etc.

This Sintering Press Machine has maximum attainable temperature : 1000 °C • Max Ramp rate: 10°C/ min • Maximum load attainable : 25 Ton • Acceptable load on graphite die is up to 5 Ton • Sintering in Ar atmosphere • Chiller water cooling

Spin Coating System (APEX) is an indispensable tool for fabricating thin films on a suitable substrate. Easy to use, safe and inexpensive, this method is extremely desirable for many applications where high qualities of layers are required.

Chemical vapour deposition unit (Technos Instruments) is an economical R&D system with uniform heating zone providing process solutions for production of single & multi walled carbon nanotube (SWCNT & MWCNT respectively) using fixed bed method.

The STA 6000 (Perkin Elmer) features theinnovative SaTurn A Sensor for high quality, simultaneous TGA and DTA measurements. This advanced sensor is optimized to achieve flat DTA baselines and high sensitivity. Because both sample and reference are measure simultaneously, you can be sure of the integrity of your analysis. The corrosion-resistant, pure platinum pan holder and reference ring make the instrument suitable for a wide variety of samples and applications.

Rf-DC Sputtering Unit, E-Beam Vacuum Coating Unit, Thermal CVD Unit

The Tecnai G2 20 S-TWIN [FEI] is a 200 Kv TEM designed to offer high-resolution imaging. The equipment provides a point resolution of 0.24 nm, line resolution of 0.14 nm and STEM resolution of 1.0 nm.

Instron-5967 Universal testing machines can perform tensile, compression, bend, peel, tear, and other mechanical tests on materials. Specifications: • 30 kN (6,750 lbf) capacity • 1212 mm (47.7 in) vertical test space • 1712 mm (67.4 in) vertical test space (Extra-height model).

LAMBDA 750 (Perkin Elmer) UV-Vis NIR Spectrophotometer instrument is a bench-top, true double-beam, double-monochromatic design providing high stability & accuracy performance for samples in the area of chemical sciences, biochemistry, materials science, nanoscience and technology.

The X-Ray Diffractometer (Panalytical X Pert Pro) is a versatile equipment designed for a wide variety of applications in X-ray diffraction analysis on powders, thin films, epitaxial layers, machined materials, ceramics etc.• The use of pre FIX optical modules, sample platform & tube rotation feature enable the user to change the system from a high resolution or stress texture point focus application to a normal Bragg-Brentano line focus configuration or a reflectrometry system.

Features (ESCA+ Omicron Nano Technology): • Small Spot XPS for High-Speed Depth Profiling • Dual BeamCharge Neutralization • Fully Integrated Software Control and Automation • Rapid Quantification within MultiPak or CASA XPS

The Zetasizer Nano ZSP (ZEN 5600) is used for the measurement of particle size upto 0.3 nm, zeta potential ofnanoparticles and surfaces.